In this paper, a multiple strip photonic mixing detector fabricated on high resistivity silicon is described. The main performance indicators such as DC characteristics, demodulation contrast and non-linearity of a test sample are simulated and experimentally characterized. Experimental results exhibit a good DC charge separation and good dynamic demodulation capabilities up to 30MHz. The influence of modulation frequency and voltage on this device is also discussed. This test device corresponds to understanding Current Assisted Photonic Device (CAPD) in term of optimizing the performance to make them in CMOS technology.